Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems

This letter compares the electromagnetic compatibility (EMC) performance of three different voltage regulator integrated circuits (ICs) (i.e., UA78L05, L78L05, and MC78L05) developed by manufacturers, with similar functionality pin compatibility, under influence low high temperature stress conditions −30 °C +100 °C). Direct power injection (DPI) was performed on these ICs to analyze impact applying thermal conducted immunity a single-tone RF disturbance signal. The DPI parameters were measured recorded in real time for an incident amplified power, while exposed conditions. It demonstrated that minimum injected required reach defined failure threshold criterion $(\pm 4$ %) varied over frequency depending ICs. Moreover, functionally identical showed significant evolution their all considered temperatures, manufacturer. Input impedance curves monitored at low, high, nominal showing noticeable decline frequencies. equivalent notation="LaTeX">$RLC$ values lumped elements resistor, inductor, capacitor) extracted compared aforementioned model supply network selected behavior further investigated generating lookup table data from measurements.